Utilizing Secondary Ion Mass Spectrometry (SIMS) for in-line metrology is a newly emerging method of process control that requires contamination-free measurements, enabling SIMS on product wafers.
New Testing Proves AURA Ion Bar™ Highly Effective in Combating COVID-19 and Other Airborne Pathogens
CHAPEL HILL, N.C.--(BUSINESS WIRE)--AURA Technologies today announced that AURA Ion Bar™, the only system in the world that creates a germ-destroying barrier across any two spaces safely using ...
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